تأثير أوجيه هو ظاهرة فيزيائية يتسبب فيها اصدار الكترون من الذرة باصدار ثانوي
عندما يزال الكترون من طبقة تحت سطحية في الذرة تاركا مكانه شاغرا ، فإن الكترونا من مستوى طاقي أعلى يملأ المكان الشاغر مسببا تحرر طاقة. وعلى الرغم من أنه في بعض الأحيان تتحرر هذه الطاقة عبر اصدار فوتون، إلا أن الطاقة قد تنتقل إلى الكترون آخر مسببا باقتلاعه من الذرة.يسمى الاكترون الثاني المقتلع باسم الكترون أوجيه.
فهرس
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X-rays or energetic electrons and measures the intensity of Auger electrons as a function of the Auger electron energy. The resulting spectra can be used to determine the identity of the emitting atoms and some information about their environment. Auger recombination is a similar Auger effect which occurs in semiconductors. An electron and electron hole (electron-hole pair) can recombine giving up their energy to an electron in the conduction band, increasing its energy. The reverse effect is known as impact ionization.
The name "Auger effect" comes from one of its discoverers, Pierre Victor Auger, and not from the similarly-named device, the auger.
The Auger emission process was discovered in the 1920s by Lise Meitner, an Austrian physicist. The Auger effect was discovered in 1925 by Pierre Victor Auger upon analysis of a Wilson cloud chamber experiment. High energy X-rays were applied to ionize gas particles and observe photoelectric electrons. Observation of electron tracks independent of the frequency of the incident photon energy suggested a mechanism for electron ionization that was caused from an internal conversion of energy of from a radiationless transition. Further investigation and theoretical work showed that the effect was a radiationless effect more than an internal conversion effect by use of elementary quantum mechanics and transition rate and transition probability calculations. (ref 1)